J2052_201607 Test Device Head Contact Duration Analysis
Stabilized
07/12/2016
- Features
- Issuing Committee
- Content
- This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
- Content
- This document is based on based on laws of physics and basic stable technology which is not dynamic in nature.
- Pages
- 7
- Citation
- SAE International Information Report, Test Device Head Contact Duration Analysis, SAE Standard J2052_201607, Stabilized July 2016, Revised January 2011, Issued March 1990, https://doi.org/10.4271/J2052_201607.