J2052_200512 Test Device Head Contact Duration Analysis
Reaffirmed
12/14/2005
- Features
- Issuing Committee
- Content
- This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
- Content
- The difference between linear head inertial forces as measured head accelerations (ax, ay, az) and measured upper neck forces (Fx, Fy, Fz) is used as an indication of externally applied loads to the head as occurs during contact. The duration of contact can thus be determined without the use of other sensors and used for HIC calculations.
- Pages
- 5
- Citation
- SAE International Information Report, Test Device Head Contact Duration Analysis, SAE Standard J2052_200512, Reaffirmed December 2005, Issued March 1990, https://doi.org/10.4271/J2052_200512.