J2052_200512 Test Device Head Contact Duration Analysis
Reaffirmed
12/14/2005
- Features
- Issuing Committee
- Content
- This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
- Pages
- 5
- Citation
- SAE International Information Report, Test Device Head Contact Duration Analysis, SAE Standard J2052_200512, Reaffirmed December 2005, Issued March 1990, https://doi.org/10.4271/J2052_200512.