J2052_201101 Test Device Head Contact Duration Analysis

Revised

01/05/2011

Features
Issuing Committee
Scope
Content
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
Rationale
Content
The committee reviewed this information report and determined that no substantial changes were needed. The reference section was reformatted and updated.
Meta TagsDetails
DOI
https://doi.org/10.4271/J2052_201101
Pages
6
Citation
SAE International Information Report, Test Device Head Contact Duration Analysis, SAE Standard J2052_201101, Revised January 2011, Issued March 1990, https://doi.org/10.4271/J2052_201101.
Additional Details
Publisher
Published
Jan 5, 2011
Product Code
J2052_201101
Content Type
Information Report
Status
Revised
Language
English