J2052_199003 TEST DEVICE HEAD CONTACT DURATION ANALYSIS

Issued

03/01/1990

Features
Issuing Committee
Scope
Content
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
Meta TagsDetails
DOI
https://doi.org/10.4271/J2052_199003
Pages
8
Citation
SAE International Information Report, TEST DEVICE HEAD CONTACT DURATION ANALYSIS, SAE Standard J2052_199003, Issued March 1990, https://doi.org/10.4271/J2052_199003.
Additional Details
Publisher
Published
Mar 1, 1990
Product Code
J2052_199003
Content Type
Information Report
Status
Issued
Language
English