J2052_199712 TEST DEVICE HEAD CONTACT DURATION ANALYSIS
Revised
12/01/1997
- Features
- Issuing Committee
- Content
- This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
- Pages
- 6
- Citation
- SAE International Information Report, TEST DEVICE HEAD CONTACT DURATION ANALYSIS, SAE Standard J2052_199712, Revised December 1997, Issued March 1990, https://doi.org/10.4271/J2052_199712.