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Semiconductor: Wire Bonding and Face Bonding Considerations and Comparisons

Published 1968-02-01 by SAE International in United States
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Paste Transfer in the Screening Process

Published 1968-02-01 by SAE International in United States
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In-Process Non-Destructive Microweld Inspection Techniques

Published 1968-02-01 by SAE International in United States
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New Uses of the Electron Microprobe Analyzer in Analysis of Integrated Circuits and Packages

Published 1968-02-01 by SAE International in United States
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Design Consideration in Thick Film Hybrid Microcircuits Layout

Published 1968-02-01 by SAE International in United States
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Simplified Automation of Microelectronic Module Interconnections

Published 1968-02-01 by SAE International in United States
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Postage Stamp Electronics

Published 1968-02-01 by SAE International in United States
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Flat Cable Transmission Line Component Assemblies for Subsystem Interconnection

Published 1968-02-01 by SAE International in United States
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The Honeywell FEB Interconnection Scheme

Published 1968-02-01 by SAE International in United States
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Laser Welding of Microcircuit Interconnections - Simultaneous Multiple Bonds of Aluminum to Kovar

Published 1968-02-01 by SAE International in United States
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