J2628_201307 Characterization, Conducted Immunity

The methods included in this document are:

1. a
   Voltage-Temperature Design Margins.
2. b
   Voltage Interruptions and Transients.
3. c
   Voltage Dropouts and Dips.
4. d
   Current Draw Under a Number of Conditions.
5. e
   Switch Input Noise

These methods are best applied during the Development stage but can be used at all stages (e.g., Pre-Qualification, Qualification or Conformity).