J1752/1_201605 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions
Revised
05/24/2016
- Features
- Issuing Committee
- Content
- This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
- Content
- The technical revisions to this standard include updating the description of the IC test printed circuit board and providing for larger size test boards to accommodate larger IC packages. References and background information have also been updated.
- Pages
- 17
- Citation
- SAE International Technical Standard, Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions, SAE Standard J1752/1_201605, Revised May 2016, Issued March 1997, https://doi.org/10.4271/J1752/1_201605.