J1752/1_201605: Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions - Technical Standard

Features

Issuing Committee: Electromagnetic Compatibility (EMC) Standards

Scope

Content: This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.

Meta Tags

Topics: Emissions measurement
Electromagnetic compatibility
Integrated circuits
Environmental testing
Semiconductor devices
Test procedures
Emissions certification
Suppliers

Details

DOI: https://doi.org/10.4271/J1752/1_201605

Citation: SAE International Technical Standard, Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions, SAE Standard J1752/1_201605, Stabilized May 2026, Revised May 2026, Issued February 1997, https://doi.org/10.4271/J1752/1_201605.

Additional Details

Publisher: SAE International

Published: Yesterday

Product Code: J1752/1_201605

Content Type: Technical Standard

Status: Revised

Language: English

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