AS6171/2 Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods

Current

10/30/2016

Features
Issuing Committee
Scope
Content
This document describes the requirements of the following test methods for counterfeit detection of electronic components:
  1. a
    Method A: General External Visual Inspection (EVI), Sample Selection, and Handling
  2. b
    Method B: Detailed EVI
  3. c
    Method C: Testing for Remarking and Resurfacing
  4. d
    Method D: Surface Texture Analysis by SEM
    NOTE: The scope of this document was focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other electronic components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide but additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types.
Rationale
Content
Counterfeit electronic components frequently have external characteristics that may be used to identify them as suspect. Visual inspection by means of optical and scanning electron microscope (SEM) techniques requires well-defined processes in order to discern and document characteristics that are consistent with counterfeit parts.
Meta TagsDetails
DOI
https://doi.org/10.4271/AS6171/2
Pages
31
Citation
SAE International Technical Standard, Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods, SAE Standard AS6171/2, Issued October 2016, https://doi.org/10.4271/AS6171/2.
Additional Details
Publisher
Published
Oct 30, 2016
Product Code
AS6171/2
Content Type
Technical Standard
Status
Current
Language
English

Revisions