Automotive
Technical Paper

The use of Micro-Processor Controls for Durability Testing

830433

2/1/1983

Event
SAE International Congress and Exposition
Authors
MATTHEW D. BYAM Schwitzer, Indianapolis, In
Abstract
Content
No Abstract available
Meta Tags
Topics
Durability
Affiliated or Co-Author
Schwitzer, Indianapolis, In
Details
DOI
https://doi.org/10.4271/830433
Citation
BYAM, M., "The use of Micro-Processor Controls for Durability Testing," SAE International Congress and Exposition, Detroit, Michigan, United States, February 28, 1983, https://doi.org/10.4271/830433.
Additional Details
Publisher
SAE International
Published
2/1/1983
Product Code
830433
Content Type
Technical Paper
Language
English