830433: The use of Micro-Processor Controls for Durability Testing - Technical Paper

Event: SAE International Congress and Exposition

Authors

MATTHEW D. BYAM

Schwitzer, Indianapolis, In

Abstract

Content: No Abstract available

Meta Tags

Topics: Durability

Affiliated or Co-Author: Schwitzer, Indianapolis, In

Details

DOI: https://doi.org/10.4271/830433

Pages: 12

Citation: BYAM, M., "The use of Micro-Processor Controls for Durability Testing," SAE Technical Paper 830433, 1983, https://doi.org/10.4271/830433.

Additional Details

Publisher: SAE International

Published: Feb 1, 1983

Product Code: 830433

Content Type: Technical Paper

Language: English