Research on Vehicle Connector Aging Accelerated Test

1999-01-1085

03/01/1999

Event
International Congress & Exposition
Authors Abstract
Content
Using tin-plated terminals generally used for vehicle connectors, we studied the variation in thickness of the oxide film on the terminal surface, progress of copper diffusion to the tin-plated layer, and terminal stress remaining rate against the ambient conditions of temperature, humidity, and oxygen concentration. As well, we collected terminals from aged vehicles for actual field data, and tested them in the same way.
We analyzed the obtained data using the regression analysis technique and obtained an expression for the relationship between the environmental factors and the transition of the terminal state as time elapses. This paper describes the accelerated test method that produces the same results as actual products used for ten years, by making calculations with the said expression.
Meta TagsDetails
DOI
https://doi.org/10.4271/1999-01-1085
Pages
8
Citation
Sugiyama, Y., Nishiwaki, H., Takahashi, M., Manabe, N. et al., "Research on Vehicle Connector Aging Accelerated Test," SAE Technical Paper 1999-01-1085, 1999, https://doi.org/10.4271/1999-01-1085.
Additional Details
Publisher
Published
Mar 1, 1999
Product Code
1999-01-1085
Content Type
Technical Paper
Language
English