Rapid Evaluation of Hermetic Seals in Automotive Microelectronic Packages Using Shearography

As the use of electronic devices in automobiles increases, the reliability of such devices is becoming increasingly important. One possible failure is due to leakage resulted from imperfect hermetical seal in mircochips and microelectronic packages. This paper presents an optical technique referred to as shearography for rapid evaluation of hermetics seals. The proposed process of leaking testing is very fast and practical.