With the technology of electronic chassis control systems of automobile is widely
used, the functional interaction between brake system and the other electronic
systems may lead to brake boost degradation. Therefore, it is necessary to find
out brake boost degradation events in the quite large number of driving
scenarios. To solve the difficulty of thoroughly and quickly searching for brake
boost degradation conditions in the large number of driving scenarios, based on
Mechatronic-Hardware-In-the-Loop (M-HIL) technology, this paper constructs an
electrical chassis system M-HIL bench to verify the function and performance of
the electronic brake control system under actual chassis system conditions. To
search and locate the brake boost degradation conditions rapidly and enhance the
searching efficiency of levels boundary of affecting factors for brake boost
degradation, firstly, based on pair-wise coverage combinatorial testing, brake
boost degradation occurrence rate is estimated and initial level combinations
including brake boost degradation events are calculated by conducting the brake
boost degradation single test of all test cases automatically. Secondly, if the
brake boost degradation occurrence rate exceeds the threshold of occurrence
rate, based on particle swarm optimization (PSO) algorithm and islet cases
expansion, levels boundary of affecting factors for brake boost degradation is
searched by execution of automatic testing program. The optimizing search
testing method proposed in this paper, which combines pair-wise coverage
combinatorial testing theory with PSO, can enhance testing efficiency for
electronic brake control system. In addition, the scenario coverage of brake
boost degradation events can also be increased by expanding islet cases.