Next Generation Test Automation

2005-01-1040

04/11/2005

Event
SAE 2005 World Congress & Exhibition
Authors Abstract
Content
This paper presents ETAS GmbH research and product development activities related to test automation for embedded systems in the automotive industry. We propose a structured approach to flexible, systematic and efficient test automation.
This research is based on several years of experience with test automation processes, products and solutions. Current research and development activities are closely linked to a pilot customer, implementing unified and automated test processes across several divisions.
Central aspects of our research include a precise definition of various tasks and roles in an overall test process, the flexible connection of test case development tools, and test bench independence.
Our research helps create test solutions which offer improved reusability of test cases and better manageability of test processes.
Meta TagsDetails
DOI
https://doi.org/10.4271/2005-01-1040
Pages
8
Citation
Anhalt, C., Lebert, K., and Tränkle, F., "Next Generation Test Automation," SAE Technical Paper 2005-01-1040, 2005, https://doi.org/10.4271/2005-01-1040.
Additional Details
Publisher
Published
Apr 11, 2005
Product Code
2005-01-1040
Content Type
Technical Paper
Language
English