“Next Generation” Means for Detecting Squeaks and Rattles in Instrument Panels
972061
05/20/1997
- Event
- Content
- Engineers doing squeak and rattle testing of instrument panels (IP's) have successfully used large electrodynamic vibration systems to identify sources of squeaks and rattles (S&R's). Their successes led to demands to test more IP's, i.e., to increase throughput of IP's to reflect the many design, material, and/or manufacturing process changes that occur, and to do so at any stage of the development, production, or QA process. What is needed is a radically different and portable way to find S&R's in a fraction of the time and at lower capital cost without compromising S&R detection results.
- Pages
- 6
- Citation
- Rusen, W., Peterson, E., McCormick, R., and Byrd, R., "“Next Generation” Means for Detecting Squeaks and Rattles in Instrument Panels," SAE Technical Paper 972061, 1997, https://doi.org/10.4271/972061.