“Next Generation” Means for Detecting Squeaks and Rattles in Instrument Panels

972061

5/20/1997

Authors
Abstract
Content
Engineers doing squeak and rattle testing of instrument panels (IP's) have successfully used large electrodynamic vibration systems to identify sources of squeaks and rattles (S&R's). Their successes led to demands to test more IP's, i.e., to increase throughput of IP's to reflect the many design, material, and/or manufacturing process changes that occur, and to do so at any stage of the development, production, or QA process. What is needed is a radically different and portable way to find S&R's in a fraction of the time and at lower capital cost without compromising S&R detection results.
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DOI
https://doi.org/10.4271/972061
Citation
Rusen, W., Peterson, E., McCormick, R., and Byrd, R., "“Next Generation” Means for Detecting Squeaks and Rattles in Instrument Panels," SAE Noise and Vibration Conference and Exposition, Traverse City, Michigan, United States, May 20, 1997, https://doi.org/10.4271/972061.
Additional Details
Publisher
Published
5/20/1997
Product Code
972061
Content Type
Technical Paper
Language
English