Investigation of the Ta5Si3 and Cr5Si3 Phases by XRD and SEM for Microstructural Characterization

In recent studies, much research is focused on the silicides alloys based in refractory transitions metal, becoming these materials as potential candidate for structural applications in high-temperatures for the fact of them possess excellent balance of properties. This work presents results of microstructural characterization of the Ta₅Si₃ and Cr₅Si₃ alloys, these silicides were obtained by arc melting under argon atmosphere. X-ray diffraction (XRD) and Scanning Electron Microscope (SEM) were used to obtain information about chemical and crystallographic characteristics of the samples generated before and after the heat-treatment.