Integration of Simulation and Testing for Microelectronics Package Reliability Improvement

980345

02/23/1998

Event
International Congress & Exposition
Authors Abstract
Content
Computer simulation has been used as a vital and powerful tool for evaluating stresses in microelectronics packages due to thermal-mechanical loading. Experimental measurement and reliability testing have been performed for modeling correlation and verification. In the past several years, the authors have been integrating computer simulation and testing to significantly improve package reliability at Motorola SPS. Several examples are presented for illustration and demonstration of the methodology.
Meta TagsDetails
DOI
https://doi.org/10.4271/980345
Pages
13
Citation
Li, Q., Dougherty, D., and Xu, Y., "Integration of Simulation and Testing for Microelectronics Package Reliability Improvement," SAE Technical Paper 980345, 1998, https://doi.org/10.4271/980345.
Additional Details
Publisher
Published
Feb 23, 1998
Product Code
980345
Content Type
Technical Paper
Language
English