Integrated Test Platforms: Taking Advantage of Advances in Computer Hardware and Software

2005-01-1044

04/11/2005

Event
SAE 2005 World Congress & Exhibition
Authors Abstract
Content
Ongoing hardware, software, and networking advances in low-cost, general-purpose computing platforms have opened the door for powerful, highly usable, integrated test platforms for demanding industrial applications. With a focus on the automotive industry, this paper reviews the pros and cons of integrated test platforms versus single-purpose and stand-alone testers. Potential improvements in in-process testing are discussed along with techniques for effectively using such testing to improve daily production quality, to maintain high production rates, to avoid unplanned downtime, and to facilitate process and product improvements and refinements through the use of monitoring, data collection, and analysis tools.
Meta TagsDetails
DOI
https://doi.org/10.4271/2005-01-1044
Pages
6
Citation
Robison, M., "Integrated Test Platforms: Taking Advantage of Advances in Computer Hardware and Software," SAE Technical Paper 2005-01-1044, 2005, https://doi.org/10.4271/2005-01-1044.
Additional Details
Publisher
Published
Apr 11, 2005
Product Code
2005-01-1044
Content Type
Technical Paper
Language
English