Improving the Repeatability of EM Susceptibility Measurements of Electronic Components When Using TEM Cells

This paper outlines a systematic approach, using a TEM cell, for evaluating the electromagnetic (EM) radiated susceptibility of electronic equipment. The purpose of the paper is to provide guidelines, for those using TEM cells for performing EM susceptibility measurements, to improve the repeatability and, hence, the value of their test results. The paper describes the test setup, details the step-by-step procedures to use in performing susceptibility measurements, and discusses pertinent information related to the range of application and limitations associated with the use of TEM cells.