Electronics Environmental Testing in Perspective - A Fresh Approach

2003-01-1360

03/03/2003

Event
SAE 2003 World Congress & Exhibition
Authors Abstract
Content
A major part of product development is to validate robustness to the environment (e.g. temperature, vibration, EMC). Although much time and expense is spent doing so, using traditional approaches often leads to “feel good” results since the product “passes”. Such a false sense of security is misleading since such validation methods can have serious deficiencies.
Presented is a Design Assurance process (Accelerated Stress Assurance Plan - ASAP) to validate modules that addresses these deficiencies. It places major emphasis on the analysis and development stages. It does not require large sample sizes, and overall test time and facilities is reduced (30-50% possible)..
Just as for electronic modules, new and major changes to IC's need a shorter validation process. As an example, a relatively fast procedure for the production and application release of improved molding compounds for IC's is presented.
Meta TagsDetails
DOI
https://doi.org/10.4271/2003-01-1360
Pages
10
Citation
Lonser, D., Nielsen, A., and Habenicht, K., "Electronics Environmental Testing in Perspective - A Fresh Approach," SAE Technical Paper 2003-01-1360, 2003, https://doi.org/10.4271/2003-01-1360.
Additional Details
Publisher
Published
Mar 3, 2003
Product Code
2003-01-1360
Content Type
Technical Paper
Language
English