Effects of Surfactant Contamination on the Next Generation Gas Trap for the ISS Internal Thermal Control System

2004-01-2429

07/19/2004

Event
International Conference On Environmental Systems
Authors Abstract
Content
The current dual-membrane gas trap is designed to remove gas bubbles from the Internal Thermal Control System (ITCS) coolant on board the International Space Station (ISS). To date it has successfully served its purpose of preventing gas bubbles from causing depriming, overspeed, and shutdown of the ITCS pumps. However, contamination in the ITCS coolant has adversely affected the gas venting rate and lifetime of the gas trap, warranting a development effort for a next-generation gas trap. Previous testing has shown that a hydrophobic-only design is capable of performing even better than the current dual-membrane design for both steady-state gas removal and gas slug removal in clean deionized water. This paper presents results of testing to evaluate the effects of surfactant contamination on the steady-state performance of the hydrophobic-only design.
Meta TagsDetails
DOI
https://doi.org/10.4271/2004-01-2429
Pages
8
Citation
Leimkuehler, T., Lukens, C., Reeves, D., and Holt, J., "Effects of Surfactant Contamination on the Next Generation Gas Trap for the ISS Internal Thermal Control System," SAE Technical Paper 2004-01-2429, 2004, https://doi.org/10.4271/2004-01-2429.
Additional Details
Publisher
Published
Jul 19, 2004
Product Code
2004-01-2429
Content Type
Technical Paper
Language
English