Digital and Analog Filters for Processing Impact Test Data
810813
06/01/1981
- Event
- Content
- A set of digital and analog low-pass filters, which meet specific data-processing criteria for impact testing, are described. The design, implementation and performance of the filters are discussed. These digital filters exhibit finite-impulse- and linear-phase-shift response characteristics. They were designed using the Remez exchange algorithm. The active analog filters, which exhibit a near linear, phase shift, Bessel response, were developed using commercially-available integrated circuits. These filters have the frequency-and channel-class characteristics advocated by the Society of Automotive Engineers in their publication “S.A.E. Recommended Practice J211b, Instrumentation for Impact Tests”.
- Pages
- 13
- Citation
- Reichert, J., and Landolt, J., "Digital and Analog Filters for Processing Impact Test Data," SAE Technical Paper 810813, 1981, https://doi.org/10.4271/810813.