Corrosion in Integrated Electronics

780925

02/01/1978

Event
Designing for Automotive Corrosion Prevention Conference
Authors Abstract
Content
A review of corrosion mechanisms in integrated electronics is presented. For metallization corrosion to occur, moisture and impurities such as Na, K or Cl must he present to form an electrolytic cell. The aluminum metallization of Integrated Circuits must be protected from the environment to prevent corrosion from occurring. Thick Film Hybrid circuits, besides being susceptable to IC corrosion mechanisms, also can fail due to dendrite formation causing shorting between gold or silver conductors that are exposed to moisture and halogen impurities.
Meta TagsDetails
DOI
https://doi.org/10.4271/780925
Pages
4
Citation
Greenstein, E., "Corrosion in Integrated Electronics," SAE Technical Paper 780925, 1978, https://doi.org/10.4271/780925.
Additional Details
Publisher
Published
Feb 1, 1978
Product Code
780925
Content Type
Technical Paper
Language
English