Control Limit Corrective Action: A Data Driven Approach to Defect Reduction

VFS-F53-255

4/29/1997

Authors
Abstract
Content

Throughout the eighties and nineties, the power of statistical thinking has revolutionized the process of manufacturing around the world. Although the utilization of statistical techniques has been advocated for most of this century, only in the last decade has the financial impact of reducing process variability become recognized as the cornerstone of being competitive in the global marketplace. At Sikorsky Aircraft, a subsidiary of United Technologies Corporation based in Stratford, Connecticut, several initiatives have harnessed the power of statistics by taking this science to a new level… the shop floor.

Meta TagsDetails
DOI
https://doi.org/10.4050/VFS-F53-255
Citation
Arther, F., "Control Limit Corrective Action: A Data Driven Approach to Defect Reduction," Forum 53 - Virginia Beach, VA 1997, Virginia Beach, VA, April 29, 1997, https://doi.org/10.4050/VFS-F53-255.
Additional Details
Publisher
Published
4/29/1997
Product Code
VFS-F53-255
Content Type
Technical Paper
Language
English