Computerized Control of Thick-Film Resistor Parameters

710799

02/01/1971

Event
National Aeronautical and Space Engineering and Manufacturing Meeting
Authors Abstract
Content
Control of thick-film resistor parameters requires a substantial amount of data to be measured and calculated. The computer is an invaluable tool for saving time and errors in testing resistor materials. How the computer is used for control of resistor materials and its availability to companies of all sizes is the theme of this paper.
Meta TagsDetails
DOI
https://doi.org/10.4271/710799
Pages
10
Citation
Kenney, P., "Computerized Control of Thick-Film Resistor Parameters," SAE Technical Paper 710799, 1971, https://doi.org/10.4271/710799.
Additional Details
Publisher
Published
Feb 1, 1971
Product Code
710799
Content Type
Technical Paper
Language
English