Computerized Control of Thick-Film Resistor Parameters
710799
2/1/1971
- Content
- Control of thick-film resistor parameters requires a substantial amount of data to be measured and calculated. The computer is an invaluable tool for saving time and errors in testing resistor materials. How the computer is used for control of resistor materials and its availability to companies of all sizes is the theme of this paper.
- Citation
- Kenney, P., "Computerized Control of Thick-Film Resistor Parameters," National Aeronautical and Space Engineering and Manufacturing Meeting, Los Angeles, California, United States, September 28, 1971, https://doi.org/10.4271/710799.