Automotive Electronic Reliability Prediction

870050

02/01/1987

Event
SAE International Congress and Exposition
Authors Abstract
Content
The intent of this paper is to present updates to and further developments of the automotive electronic component reliability prediction models previously developed and summarized in SAE paper 840486. The relatively simplistic models presented previously have been further developed to account for factors such as temperature, decreasing failure rate with time, and nonoperating period failure rates. Models have been developed for microcircuits, diodes, transistors, capacitors, and resistors. These efforts are part of an on-going activity of the electronic reliability subcommittee of the SAE's electronics committee to analyze failure rate information on automotive electronic components and provide the automotive community with a means to predict electronic reliability.
Meta TagsDetails
DOI
https://doi.org/10.4271/870050
Pages
16
Citation
Denson, W., and Priore, M., "Automotive Electronic Reliability Prediction," SAE Technical Paper 870050, 1987, https://doi.org/10.4271/870050.
Additional Details
Publisher
Published
Feb 1, 1987
Product Code
870050
Content Type
Technical Paper
Language
English