A new test method, Current Decay, has been developed which aids in the early detection and removal of premature light source failures. These failures, whether mechanical or developmental, can go undetected until later processes where the severity of a failure has increased.
The Current Decay test method provides the lamp assembly manufacture a repeatable and more accurate method to perform the light-up verification of the lamp assemblies’ bulbs. Traditional light-up techniques are deficient in detecting certain failure modes including their various failure degrees. Especially when the light sources, bulbs, are inside the lamp assemblies making it difficult for an operator to notice the defect.