Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods
- Aerospace Standard
Method A: General External Visual Inspection (EVI), Sample Selection, and Handling
Method B: Detailed EVI
Method C: Testing for Remarking and Resurfacing
Method D: Surface Texture Analysis by SEM
NOTE: The scope of this document was focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other electronic components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide but additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types.
For those tasked with detecting counterfeit electrical, electronic, and electromechanical (EEE) Parts, the SAE Counterfeit Defect Coverage Tool, in conjunction with SAE AS6171, is a dynamic, web-based application for developing a counterfeit detection test sequence and its associated counterfeit defect coverage while considering the resources necessary to implement those tests.
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Data Sets - Support Documents
|Unnamed Dataset 1|
To develop an inspection/test matrix plan for different classes of Electrical, Electronic, and Electromechanical (EEE) commodities to detect suspect and confirmed counterfeit components. The matrix will include recommended visual, physical, electrical, and material testing based on different commodities and associated tier level of determined risk. The plan will include a process for evaluating risk. The plan will provide guidance on the recommended tier level of testing that should be performed based on risk of the supplier, the item, application, and other risk factors. It will also include recommended sampling plans for the tests based on tier level of accepted risk, level of confidence required, and acceptable reject criteria.