AS6171/2 Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods
Current
10/30/2016
- Content
- This document describes the requirements of the following test methods for counterfeit detection of electronic components:
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a
Method A: General External Visual Inspection (EVI), Sample Selection, and Handling
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b
Method B: Detailed EVI
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c
Method C: Testing for Remarking and Resurfacing
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d
Method D: Surface Texture Analysis by SEM
NOTE: The scope of this document was focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other electronic components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide but additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types.
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a
- Pages
- 31
- Citation
- SAE International Technical Standard, Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods, SAE Standard AS6171/2, Issued October 2016, https://doi.org/10.4271/AS6171/2.