Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions
Published May 24, 2016 by SAE International in United States
This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
The technical revisions to this standard include updating the description of the IC test printed circuit board and providing for larger size test boards to accommodate larger IC packages. References and background information have also been updated.
Data Sets - Support Documents
|[Unnamed Dataset 1]|
|Table 3||Test board ground plane interconnect via positions|
|Table 4||IC pin loading recommendations|
3 versions available
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