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Effects of Surfactant Contamination on the Next Generation Gas Trap for the ISS Internal Thermal Control System
Technical Paper
2004-01-2429
ISSN: 0148-7191, e-ISSN: 2688-3627
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English
Abstract
The current dual-membrane gas trap is designed to remove gas bubbles from the Internal Thermal Control System (ITCS) coolant on board the International Space Station (ISS). To date it has successfully served its purpose of preventing gas bubbles from causing depriming, overspeed, and shutdown of the ITCS pumps. However, contamination in the ITCS coolant has adversely affected the gas venting rate and lifetime of the gas trap, warranting a development effort for a next-generation gas trap. Previous testing has shown that a hydrophobic-only design is capable of performing even better than the current dual-membrane design for both steady-state gas removal and gas slug removal in clean deionized water. This paper presents results of testing to evaluate the effects of surfactant contamination on the steady-state performance of the hydrophobic-only design.
Authors
Citation
Leimkuehler, T., Lukens, C., Reeves, D., and Holt, J., "Effects of Surfactant Contamination on the Next Generation Gas Trap for the ISS Internal Thermal Control System," SAE Technical Paper 2004-01-2429, 2004, https://doi.org/10.4271/2004-01-2429.Also In
References
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