Using Source Measure Units to Characterize High Power Semiconductors (Part 2)
TBMG-16993
08/01/2013
- Content
Part 1 of this article, which appeared in the August 2013 issue of NASA Tech Briefs, dealt with ON-state characterization of high power semiconductors (). Part 2 concludes this discussion with an overview of OFF-state characterization.
- Citation
- "Using Source Measure Units to Characterize High Power Semiconductors (Part 2)," Mobility Engineering, August 1, 2013.