Magazine Article

Using Source Measure Units to Characterize High Power Semiconductors (Part 2)

TBMG-16993

08/01/2013

Abstract
Content

Part 1 of this article, which appeared in the August 2013 issue of NASA Tech Briefs, dealt with ON-state characterization of high power semiconductors (). Part 2 concludes this discussion with an overview of OFF-state characterization.

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Citation
"Using Source Measure Units to Characterize High Power Semiconductors (Part 2)," Mobility Engineering, August 1, 2013.
Additional Details
Publisher
Published
Aug 1, 2013
Product Code
TBMG-16993
Content Type
Magazine Article
Language
English