Magazine Article

Using Source Measure Units to Characterize High Power Semiconductors (Part 2)

TBMG-16993

8/1/2013

Abstract
Content

Part 1 of this article, which appeared in the August 2013 issue of NASA Tech Briefs, dealt with ON-state characterization of high power semiconductors (). Part 2 concludes this discussion with an overview of OFF-state characterization.

Meta Tags
Topics
Technical review
Semiconductors
Measurements
Details
Citation
"Using Source Measure Units to Characterize High Power Semiconductors (Part 2)," Mobility Engineering, August 1, 2013.
Additional Details
Publisher
Tech Briefs Media Group
Published
8/1/2013
Product Code
TBMG-16993
Content Type
Magazine Article
Language
English