Using Source Measure Units to Characterize High-Power Semiconductors (Part 1)

The proliferation of electronic control and electronic power conversion into a variety of industries (e.g., energy generation, industrial motor drives and control, transportation, and IT) has made efficient power semiconductor device design and test more critical than ever. To demonstrate technology improvements, new device capabilities must be compared with those of existing devices. The use of semiconductor materials other than silicon demands the use of new processes. To be sustainable, these new processes must be tuned to deliver consistent results and high production yield. As new device designs are developed, reliability measurements must be performed on many devices over long periods. Therefore, test engineers must identify test equipment that is not only accurate, but scalable and cost-effective.