Single-Event Latchup Protection of Integrated Circuits

Many commercially available advanced-technology CMOS and bipolar integrated circuits are susceptible to single-event latchup (SEL) effects caused by heavy ions or protons from cosmic rays or solar flares, making them unsuitable for satellite applications. Remanufacturing the integrated circuits in an inherently SEL-immune process has been an expensive and technically difficult option, as is the alternate option of incorporating latchup protection and recovery circuitry in the spacecraft system's electronics.