Self-Checking Circuitry for Detecting Single-Event Latchups

High-performance electronic circuits would incorporate self-checking features for detection of radiation-induced single-event latchups (SELs), according to a proposal. The basic SEL-detection scheme calls for redundant circuitry and a current-voting scheme similar to voting schemes that have been used to reveal malfunctions in other redundant systems. The redundancy and voting scheme could also be combined with other fault-tolerance features [e.g., for detection of single-event upsets (SEUs)].