Scanning Slit Profiler for Characterizing Optical Assemblies

Optical assemblies are used in an extensive range of technical applications to deliver a laser beam of a certain size, quality, and intensity to a region of space. While different techniques and instruments are available for profiling laser beams, this versatile design uses scanning slits to accommodate a wider variety of wavelengths, beam powers, and beam sizes. In many applications scanning slits eliminate the need for additional optics, such as lenses and attenuators. Attenuation optics can distort a laser's beam and add additional complexity into the measurement. They also prohibit analysis of a beam at its focus because the attenuator increases the optical path length of the beam and may add aberrations. Slit scanners can typically measure down to 4 microns without the use of magnifying lenses.