Residual Stress Measurement using X-Ray Diffraction Techniques, Guidelines and Normative Standards
- Event
- Content
- Several residual stress (RS) measurement standards that employ x-ray diffraction (XRD) techniques are available for users in Europe, North America, Japan and other countries. Such standards are similar in principle however the detailed requirements for each standard are different. RS measurements performed on critical components require a good knowledge of XRD techniques and current best practices so that they can be correctly applied to the challenging geometries and exotic materials that often compose critical components of interest. This paper will compare the key requirements found in the various RS measurement guidelines and standards currently available to users while emphasizing and justifying current best practices as they apply to the measurement of RS on mechanical components used in the automotive and the aerospace industry.
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- 5
- Citation
- Belassel, M., "Residual Stress Measurement using X-Ray Diffraction Techniques, Guidelines and Normative Standards," SAE Int. J. Mater. Manf. 5(2):352-356, 2012, https://doi.org/10.4271/2012-01-0186.