Residual Stress Measurement using X-Ray Diffraction Techniques, Guidelines and Normative Standards

Event
SAE 2012 World Congress & Exhibition
Authors Abstract
Content
Several residual stress (RS) measurement standards that employ x-ray diffraction (XRD) techniques are available for users in Europe, North America, Japan and other countries. Such standards are similar in principle however the detailed requirements for each standard are different. RS measurements performed on critical components require a good knowledge of XRD techniques and current best practices so that they can be correctly applied to the challenging geometries and exotic materials that often compose critical components of interest. This paper will compare the key requirements found in the various RS measurement guidelines and standards currently available to users while emphasizing and justifying current best practices as they apply to the measurement of RS on mechanical components used in the automotive and the aerospace industry.
Meta TagsDetails
DOI
https://doi.org/10.4271/2012-01-0186
Pages
5
Citation
Belassel, M., "Residual Stress Measurement using X-Ray Diffraction Techniques, Guidelines and Normative Standards," SAE Int. J. Mater. Manf. 5(2):352-356, 2012, https://doi.org/10.4271/2012-01-0186.
Additional Details
Publisher
Published
Apr 16, 2012
Product Code
2012-01-0186
Content Type
Journal Article
Language
English