Radiation-Tolerant Dual Data Bus

An architecture, and a method of utilizing the architecture, have been proposed to enable error-free operation of a data bus that includes, and is connected to, commercial off-the-shelf (COTS) circuits and components that are inherently susceptible to single-event upsets [SEUs (bit flips caused by impinging high-energy particles and photons)]. The architecture and method are applicable, more specifically, to data-bus circuitry based on the Institute for Electrical and Electronics Engineers (IEEE) 1394b standard for a high-speed serial bus.