Magazine Article

Pulsed Laser System to Simulate Effects of Cosmic Rays in Semiconductor Devices

TBMG-10549

07/01/2011

Abstract
Content

Spaceflight system electronic devices must survive a wide range of radiation environments with various particle types including energetic protons, electrons, gamma rays, x-rays, and heavy ions. High-energy charged particles such as heavy ions can pass straight through a semiconductor material and interact with a charge-sensitive region, generating a significant amount of charge (electron-hole pairs) along their tracks. These excess charges can damage the device, and the response can range from temporary perturbations to permanent changes in the state or performance. These phenomena are called single event effects (SEE).

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Citation
"Pulsed Laser System to Simulate Effects of Cosmic Rays in Semiconductor Devices," Mobility Engineering, July 1, 2011.
Additional Details
Publisher
Published
Jul 1, 2011
Product Code
TBMG-10549
Content Type
Magazine Article
Language
English