Overcoming Pitfalls When Measuring Thin, Parallel Optics

Driven by the demand for smaller and smaller consumer products and semiconductor devices, manufacturers require thin planar optics for an array of applications. This puts the responsibility on the material and optics manufacturers to ensure the glass is flat and free of material deformities that can cause distortion and affect end-use functionality. This places a huge burden on metrology tools that need to measure and confirm the uniformity of thin planar optics, thereby proving that they are fit for purpose.