New Method Detects Defects in 2D Materials

Researchers have developed a technique to quickly and sensitively characterize defects in 2D materials used in sensors and electronics. Their solution is to use laser light combined with a phenomenon called second harmonic generation, in which the frequency of the light shone on the material reflects at double the original frequency. Add to this a technique called dark field imaging, in which extraneous light is filtered out so that defects shine through.