Miniature Scanning Electron Microscope

A miniature scanning electron microscope (SEM) with a capability for x-ray microanalysis has been proposed. This SEM would be particularly suitable for analyzing samples of dust, soil, drill tailings, and other finely divided solids collected in various environments. Designed for use in the robotic exploration of remote planets, asteroids, and comets, this instrument could also be used on Earth, where it could be operated in the field as well as in the laboratory.