Micro-XRF for In Situ Geological Exploration of Other Planets

TBMG-16785

07/01/2013

Abstract
Content

analysis of rock chemistry is a fundamental tool for exploration of planets. To meet this need, a high-spatial- resolution micro x-ray fluorescence (Micro-XRF) instrument was developed that is capable of determining the elemental composition of rocks (elements Na–U) with 100 μm spatial resolution, thus providing insight to the composition of features as small as sand grains and individual laminae. The resulting excitation beam is of sufficient intensity that high signal-to-noise punctual spectra are acquired in seconds to a few minutes using an Amptek Silicon Drift Detector (SDD).

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Citation
"Micro-XRF for In Situ Geological Exploration of Other Planets," Mobility Engineering, July 1, 2013.
Additional Details
Publisher
Published
Jul 1, 2013
Product Code
TBMG-16785
Content Type
Magazine Article
Language
English