Micro-XRF for In Situ Geological Exploration of Other Planets

analysis of rock chemistry is a fundamental tool for exploration of planets. To meet this need, a high-spatial- resolution micro x-ray fluorescence (Micro-XRF) instrument was developed that is capable of determining the elemental composition of rocks (elements Na–U) with 100 μm spatial resolution, thus providing insight to the composition of features as small as sand grains and individual laminae. The resulting excitation beam is of sufficient intensity that high signal-to-noise punctual spectra are acquired in seconds to a few minutes using an Amptek Silicon Drift Detector (SDD).