Measuring Layer Thickness Using a Microscope

The metrology arm of Japanese camera giant Nikon, which manufactures optical instruments including industrial measuring microscopes, has added a new Layer Thickness software module to its NIS-Elements imaging platform to streamline inspection, analysis and reporting of cross-sectional layer depths as well as surface feature widths. The option not only speeds quality control by semi-automating various functions, it also improves reliability by reducing the risk of human error in feature recognition, interpretation of results and numerical calculation. Applications for the software can be found across industry and science, from manufacturing and materials research to medicine and mineralogy.