High-Cycle Life Testing of RF MEMS Switches

TBMG-4933

12/01/2008

Abstract
Content

The electromechanical, RF, and charging properties of an "air-gap" capacitive switch enable it to be utilized in high-cycle life testing. Monitoring both high-speed and low-speed switching characteristics provides insight into quantifying the lifetime properties of the switch, and enable estimation of switching lifetime under a variety of operating conditions.

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Citation
"High-Cycle Life Testing of RF MEMS Switches," Mobility Engineering, December 1, 2008.
Additional Details
Publisher
Published
Dec 1, 2008
Product Code
TBMG-4933
Content Type
Magazine Article
Language
English