GE scanner enhances defect detection for industrial CT

GE Measurement & Control is offering its proprietary scatter|correct technology to industrial microCT users of GE's phoenix v|tome|x m CT (computed tomography) system. It provides CT data quality improvements for high energy microfocus CT scans with up to 300 kV.

The scatter|correct technology enhances defect detection and analysis as well as 3D metrology in mobility sectors including aerospace, automotive, and off-highway, as well as the power generation industry. It can be applied to high scattering materials such as steel and aluminum, composites, and multimaterial samples.