GE scanner enhances defect detection for industrial CT

GE Measurement & Control is offering its proprietary scatter|correct technology to industrial microCT users of GE's phoenix v|tome|x m CT (computed tomography) system. It provides CT data quality improvements for high energy microfocus CT scans with up to 300 kV.

The scatter|correct technology enhances defect detection and analysis as well as 3D metrology in the aerospace, automotive, and power generation sectors. It can be applied to high scattering materials such as steel and aluminum, composites, and multi-material samples.