On-Chip Correction for Defective Pixels in an Image Sensor

A method of correcting for defective pixels in an integrated-circuit image sensor of the active-pixel sensor (APS) type has been proposed. The corrections would be made by additional readout circuitry on the image-sensor chips. By making it unnecessary to discard sensor chips that contain limited numbers of scattered defects, the method would increase effective production yields and thereby lower the costs of individual image sensors.