Apparatus Measures X-Ray Diffraction and Fluorescence

The figure depicts an apparatus for measuring x-ray diffraction (XRD) and/or x-ray fluorescence (XRF) in a specimen of material. The specimen could be, for example, a standard XRD powder sample of a mineral, the elemental composition of which one seeks to identify. It is common practice to characterize samples in terms of both XRD and XRF, but heretofore, it has been necessary to use separate XRD and XRF apparatuses.