Absolute Position Encoders Using Pattern Recognition

Innovative optoelectronic encoders for measuring absolute, linear or angular position with super-high resolution have been invented. The new encoders rely on a combination of high-accuracy microlithography, optical projection, charge-coupled-device (CCD) array image detection, and image processing. Compared to conventional absolute encoders, the new encoders allow practically unlimited travel at exceptionally high resolution and are far less susceptible to scale damage or contamination.